1. Evaluation of serial crystallographic structure determination within megahertz pulse trains
- Author
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Yefanov, Oleksandr, Oberthür, Dominik, Bean, Richard, Wiedorn, Max O., Knoska, Juraj, Pena, Gisel, Awel, Salah, Domaracky, Martin, Sarrou, Iosifina, Lourdu Xavier, P., Metz, Markus, Bajt, Saša, Mariani, Valerio, Gevorkov, Yaroslav, White, Thomas A., Tolstikova, Aleksandra, Villanueva-Pérez, Pablo, Seuring, Carolin, Aplin, Steve, Estillore, Armando D., Küpper, Jochen, Klyuev, Alexander, Kuhn, Manuela, Laurus, Torsten, Graafsma, Heinz, Monteiro, Diana C. F., Trebbin, Martin, Maia, Filipe R. N. C., Cruz-Mazo, Francisco, Gañán-Calvo, Alfonso M., Universidad de Sevilla. Departamento de Ingeniería Aeroespacial y Mecánica de Fluidos, and Universidad de Sevilla. TEP 219 : Física de Fluidos y Microfluidica
- Subjects
Free Electron Lasers ,Crystallography ,X-Ray Laser - Abstract
The new European X-ray Free-Electron Laser (European XFEL) is the first X-ray free-electron laser capable of delivering intense X-ray pulses with a megahertz interpulse spacing in a wavelength range suitable for atomic resolution structure determination. An outstanding but crucial question is whether the use of a pulse repetition rate nearly four orders of magnitude higher than previously possible results in unwanted structural changes due to either radiation damage or systematic effects on data quality. Here, separate structures from the first and subse- quent pulses in the European XFEL pulse train were determined, showing that there is essentially no difference between structures deter- mined from different pulses under currently available operating conditions at the European XFEL.
- Published
- 2019