5 results on '"Green, Nelson"'
Search Results
2. Methods for Resistivity Measurements Related to Spacecraft Charging
- Author
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Dennison, John R., Brunson, Jerilyn, Swaminathan, Prasanna, Green, Nelson, Frederickson, A. Robb, and Institute of Electrical and Electronics Engineers
- Subjects
Material storage ,Charge measurement ,Insulation ,Polymers ,# Aircraft manufacture ,Polarization ,Physics ,Conductivity measurement ,Electrical resistance measurement ,Current measurement ,Materials testing - Abstract
A key parameter in modeling differential spacecraft-charging is the resistivity of insulating materials. This parameter determines how charge will accumulate and redistribute across the spacecraft, as well as the timescale for charge transport and dissipation. American Society for Testing and Materials constant-voltage methods are shown to provide inaccurate resistivity measurements for materials with resistivities greater than ~1017 Omegamiddotcm or with long polarization decay times such as are found in many polymers. These data have been shown to often be inappropriate for spacecraft-charging applications and have been found to underestimate charging effects by one to four orders of magnitude for many materials. The charge storage decay method is shown to be the preferred method to determine the resistivities of such highly insulating materials. A review is presented of methods to measure the resistivity of highly insulating materials-including the electrometer in resistance method, the electrometer in constant-voltage method, and the charge storage method. The different methods are found to be appropriate for different resistivity ranges and for different charging circumstances. A simple macroscopic physics-based model of these methods allows separation of the polarization current and dark current components from long-duration measurements of resistivity over day- to month-long timescales. Model parameters are directly related to the magnitude of charge transfer and storage and the rate of charge transport. The model largely explains the observed differences in resistivity found using the different methods and provides a framework for recommendations for the appropriate test method for spacecraft materials with different resistivities and applications
- Published
- 2006
3. Methods For High Resistivity Measurements Related To Spacecraft Charging
- Author
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Dennison, JR, Brunson, Jerilyn, Swaminathan, Prasanna, Green, Nelson, and Frederickson, A Robb
- Subjects
Physics ,Condensed Matter Physics - Abstract
A key parameter in modeling differential spacecraft charging is the resistivity of insulating materials. This parameter determines how charge will accumulate and redistribute across the spacecraft, as well as the time scale for charge transport and dissipation. ASTM constant voltage methods are shown to provide inaccurate resistivity measurements for materials with resistivities greater than ~1017 Ω-cm or with long polarization decay times such as are found in many polymers. These data have been shown to often be inappropriate for spacecraft charging applications, and have been found to underestimate charging effects by one to four orders of magnitude for many materials. The charge storage decay method is shown to be the preferred method to determine the resistivities of such highly insulating materials. A review is presented of methods to measure the resistivity of highly insulating materials—including the electrometer-resistance method, the electrometer-constant voltage method, and the charge storage method. The different methods are found to be appropriate for different resistivity ranges and for different charging circumstances. A simple, macroscopic, physics-based model of these methods allows separation of the polarization current and dark current components from long duration measurements of resistivity over day- to month-long time scales. Model parameters are directly related to the magnitude of charge transfer and storage and the rate of charge transport. The model largely explains the observed differences in resistivity found using the different methods and provides a framework for recommendations for the appropriate test method for spacecraft materials with different resistivities and applications.
- Published
- 2006
4. Charge Storage Measuremens of Resistivity for Dielectric Samples from the CRRES Internal Discharge Monitor
- Author
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Green, Nelson W., Frederickson, A. R., and Dennison, JR
- Subjects
Physics - Published
- 2005
5. Experimentally Derived Resistivity for Dielectric Samples From the CRRES Internal Discharge Monitor
- Author
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Green, Nelson W., Frederickson, A. Robb, Dennison, John R., Spacecraft Charging Technology, and Institute of Electrical and Electronics Engineers
- Subjects
spacecraft charging ,Radiation monitoring ,Dielectric measurements ,Satellites ,宇宙機帯電 ,Resistivity ,Radiation effects ,CRRES ,誘電体 ,dielectric ,Conductivity ,polarization ,暗電流 ,Physics ,dark current ,Time measurement ,aerospace environment ,Current measurement ,charged particle ,electric field ,航空宇宙環境 ,荷電粒子 ,monitor ,電場 ,Performance evaluation ,分極 ,抵抗率 ,Materials testing - Abstract
Resistivity values were experimentally determined using charge storage methods for six samples remaining from the construction of the Internal Discharge Monitor (IDM) flown on the Combined Release and Radiation Effects Satellite (CRRES). Three tests were performed over a period of four to five weeks each in a vacuum of approximately 5 x 10(exp -6) torr with an average temperature of approximately 25 C to simulate a space environment. Samples tested included FR4, PTFE, and alumina with copper electrodes attached to one or more of the sample surfaces. FR4 circuit board material was found to have a dark current resistivity of approximately 1 x 10(exp 18) Ohm-cm and a moderately high polarization current. Fiber filled PTFE exhibited little polarization current and a dark current resistivity of approximately 3 x 10(exp 20) Ohm-cm. Alumina had a measured dark current resistivity of approximately 3 x 10(exp 17) Ohm-cm, with a very large and more rapid polarization. Experimentally determined resistivity values were two to three orders of magnitude more than found using standard ASTM test methods. The one minute wait time suggested for the standard ASTM tests is much shorter than the measured polarization current decay times for each sample indicating that the primary currents used to determine ASTM resistivity are caused by the polarization of molecules in the applied electric field rather than charge transport through the bulk of the dielectric. Testing over much longer periods of time in vacuum is required to allow this polarization current to decay away and to allow the observation of charged particles transport through a dielectric material. Application of a simple physics-based model allows separation of the polarization current and dark current components from long duration measurements of resistivity over day- to month-long time scales. Model parameters are directly related to the magnitude of charge transfer and storage and the rate of charge transport., 資料番号: AA0049206017, レポート番号: JAXA-SP-05-001E
- Published
- 2005
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