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There is a need for nanoparticle generators with well characterised properties in many fields. For instance the calibration of measurement instruments can be done in place and the downtime for the instrument hence decreased. Also in nanoparticle toxicity experiments it is very important to have a well characterised particle source [1]. The aim of this study was to develop a calibrated nanoparticle generator with stable particle production. The number concentration should be regulated over many orders of magnitude and the particle size should also be adjustable. In this paper the design of the nanoparticle generator and the properties of the produced nanoparticles at one furnace temperature are presented.

Practical assessment of risks for Electrostatic Discharge (ESD) failures of semiconductor devices, due to charges induced on devices in a manufacturing or repair environment of electronics has been difficult, because easily measurable parameters such as the electrostatic field and the potential of a charged surface do not directly quantify the risk. In this paper a new method of assessing the risks with induction charging of a sensitive device is presented by introducing a well-defined dummy device, which is a simple modification of the probe of DC type non-contacting electrostatic voltmeter. By placing the modified potential probe (mimicking large sensitive device) in front of charged surface, risks of ESD failure for a device due to induction charging can be assessed. The electrostatic response of the probe at different distances between charged surface and the probe has been verified by numerical model calculations. (6 refs.)