1. Characterizing 3D floating gate NAND flash
- Author
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Xiong, Q., Wu, F., Lu, Zhonghai, Zhu, Y., Zhou, Y., Chu, Y., Xie, C., Huang, P., Xiong, Q., Wu, F., Lu, Zhonghai, Zhu, Y., Zhou, Y., Chu, Y., Xie, C., and Huang, P.
- Abstract
In this paper, we characterize a state-of-The-Art 3D oating gate NAND ash memory through comprehensive experiments on an FPGA platform. Then, we present distinct observations on performance and reliability, such as operation latencies and various error patterns. We believe that through our work, novel 3D NAND ash-oriented designs can be developed to achieve better performance and reliability., QC 20170816
- Published
- 2017
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