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1. The ultrafast excitation processes in femtosecond laser-induced damage in dielectric omnidirectional reflectors

Author

T.Q. Jia, S.Z. Xu, R.X. Li, Z.Z. Xu, Kuroda, H., H.Y. Sun, X.X. Li, D.H. Feng, and C.B. Li

Subjects
Collisional excitation -- Analysis, Dielectric devices -- Optical properties, Ablation (Vaporization technology) -- Analysis, Physics
Abstract

A pump and probe system, where the pump pulse is stretched up and is much longer than the probe pulse duration, is developed and the time-resolved excitation processes in omnidirectional reflectors Si[O.sub.2]/Ti[O.sub.2] and ZnS/Mg[F.sub.2] studied. The results reveal that as the pump pulse energy is higher than the threshold value, the reflectivity of the probe, the reflectivity of the probe pulse decreases rapidly during former half, rather than around the peak of the pump pulse.

Published
2006

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