Author: "Yen-Ting Chen" / Database: Gale General OneFile - Searchworks@Jio Institute Digital Library Search Results

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Author: Hung-Chang Sun, Ching-Fang Huang, Yen-Ting Chen, Ting-Yun Wu, Chee Wee Liu, Hsu, Y.-J., and Chen, J.
Subjects: Polysilicon -- Electric properties, Field-effect transistors -- Innovations, Electron mobility -- Methods, Voltage -- Measurement, Simulation methods -- Usage, Business, Electronics, Electronics and electrical industries
Published: 2010

Author: Yaw-Huei Hwang, Yen-Ting Chen, Jao-Yu Yeh, and Huey-Wen Liang
Subjects: Human-computer interaction -- Analysis, Reliability (Engineering) -- Analysis, Computers -- Usage, Loading and unloading -- Physiological aspects, Software/hardware leasing, Architecture and design industries, Business
Published: 2010

Author: Ching-Lien Hsiao, Jr-Tai Chen, Hsu-Cheng Hsu, Ying-Chieh Liao, Po-Han Tseng, Yen-Ting Chen, Zhe Chuan Feng, Li-Wei Tu, Chou, Mitch M.C., Li-Chyong Chen, and Kuei-Hsien Chen
Subjects: Aluminum oxide -- Electric properties, Aluminum oxide -- Optical properties, Indium -- Electric properties, Indium -- Optical properties, Lithium alloys -- Electric properties, Lithium alloys -- Optical properties, Molecular beams -- Usage, Transmission electron microscopes -- Usage, Physics
Abstract: Plasma-assisted molecular-beam epitaxy is employed to recognize heteroepitaxial growth of m-plane (1010) InN film on (100)-[gamma]-LiAl[O.sub.2] (LAO) substrate. The structural anisotropy of the m-plane InN epitaxied on LAO is attributed to the [I.sub.1] type base-plane stacking faults according to the modified Williamson-Hall and transmission electron microscopy (TEM) analyses.
Published: 2010

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