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2 results on '"Lansiaux, X."'

1. m-line spectroscopy for optical analysis of thick LiNbO3 layers grown on sapphire substrates by radio-frequency multistep sputtering

Author

Dogheche, E., Lansiaux, X., and Remiens, D.

Subjects
Thick films -- Optical properties, Thick films -- Mechanical properties, Sputtering (Physics) -- Analysis, Lithium niobate -- Mechanical properties, Lithium niobate -- Optical properties, Physics
Abstract

Thick films of lithium niobate are epitaxially grown on sapphire substrates by multistep radio frequency magnetron sputtering. Results indicate that the angular width of the excited optical guided modes varies with the film thickness.

Published
2003

2. LiNbO3 thick films grown on sapphire by using a multistep sputtering process

Author

Lansiaux, X., Dogheche, E., Remiens, D., Guilloux-Viry, M., Perrin, A., and Ruterana, P.

Subjects
Sputtering (Physics) -- Research, Thick films -- Research, Thick films -- Optical properties, Lithium niobate -- Research, Lithium niobate -- Optical properties, Physics
Abstract

The results of investigations of lithium niobate (LiNbO3) films grown on (0001) sapphire substrate by radio-frequency magnetron sputtering are presented. The film properties between each growth step and between the substrate to layer interface, directly from the measured optical data are qualified.

Published
2001

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