1. Development of a 20MeV proton particle-induced X-ray emission analysis method in a helium atmosphere.
- Author
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Ishii, Keizo, Terakawa, Atsuki, Hitomi, Keitaro, and Nogami, Mitsuhiro
- Subjects
PROTON-induced X-ray emission ,HELIUM ,POSITRON emission tomography ,NONDESTRUCTIVE testing ,ATMOSPHERIC pressure - Abstract
We developed a 20 MeV particle-induced X-ray emission (PIXE) analysis method using a medical cyclotron, which is conventionally used for positron emission tomography analysis performed in vacuo, during which the target sample is damaged. For non-destructive analysis and ease of switching between target samples, we developed a technique allowing 20 MeV proton PIXE analysis to be performed at the atmospheric pressure. We filled the PIXE analysis chamber with helium and checked that the continuous background of the Compton tails of nuclear reaction γ -rays increased only minimally, and that the quasi-free electron bremsstrahlung (QFEB) did not increase at all, in the X-ray energy spectrum. [ABSTRACT FROM AUTHOR]
- Published
- 2019
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