1. Overview over Surface Sensitive X-Ray Techniques.
- Author
-
Seeck, Oliver H.
- Subjects
PROPERTIES of matter ,X-ray scattering ,SMALL-angle X-ray scattering ,NEUTRON reflectivity ,X-ray fluorescence - Abstract
This article provides an overview of surface sensitive X-ray techniques, explaining how scientists use X-rays to study the atomic and electronic structure of matter. It discusses the concept of surface sensitivity and the methods used to achieve it in X-ray scattering experiments. The article also introduces a new method called surface sensitive measurement of the Pair Distribution Function (sPDF) for studying the atomic structure of surface layers. It discusses mathematical representations of sample surfaces, the use of crystals in extracting surface scattering information, and the technique of X-ray reflectivity. The article outlines the requirements and preconditions for conducting surface sensitive X-ray experiments and discusses different setups and advancements in the field. It concludes by discussing future directions for surface sensitive X-ray scattering methods. [Extracted from the article]
- Published
- 2024
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