1. Tip-enhanced Raman mapping of local strain in graphene.
- Author
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Ryan Beams, Luiz Gustavo Cançado, Ado Jorio, A Nick Vamivakas, and Lukas Novotny
- Subjects
GRAPHENE ,STRAINS & stresses (Mechanics) ,SURFACE enhanced Raman effect ,STATICS ,NANOTECHNOLOGY ,BAND gaps - Abstract
We demonstrate local strain measurements in graphene by using tip-enhanced Raman spectroscopy (TERS). We find that a single 5 nm particle can induce a radial strain over a lateral distance of ∼170 nm. By treating the particle as a point force on a circular membrane, we find that the strain in the radial direction (r) is , in agreement with force-displacement measurements conducted on suspended graphene flakes. Our results demonstrate that TERS can be used to map out static strain fields at the nanoscale, which are inaccessible using force-displacement techniques. [ABSTRACT FROM AUTHOR]
- Published
- 2015
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