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6 results on '"Pelloie, Jean-Luc"'

2. Hot-Carrier Effects and Reliable Lifetime Prediction in Deep Submicron N- and P-Channel SOI MOSFET's.

Author

Renn, Shing-Hwa and Pelloie, Jean-Luc

Subjects
SILICON-on-insulator technology, METAL oxide semiconductor field-effect transistors, HOT carriers, SCIENTIFIC experimentation
Abstract

Presents information on a study which investigated the hot-carrier effects in deep submicron N- and P-channel silicon-on-insulator (SOI) metal-oxide semiconductor field-effect transistors. Experimental details; Results and discussion of the study; Conclusions.

Published
1998
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3. Generation-recombination transient effects in partially...

Author

Munteanu, Daniela, Weiser, Douglas A., Cristoloveanu, Sorin, Faynot, Oliver, Pelloie, Jean-Luc, and Fossum, Jerry G.

Subjects
METAL oxide semiconductor field-effect transistors, SILICON-on-insulator technology
Abstract

Presents a study which described a family of gate-induced transient effects that can occur in floating-body partially depleted metal oxide field effect transistor (MOSFET). Experimental methods; Spice model including body thermal generation; Simulation results; Conclusion.

Published
1998
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4. Hot-carrier effects and lifetime prediction in off-state...

Author

Renn, Shing-Hwa, Rauly, Emmanuel, Pelloie, Jean-Luc, and Balestra, Francis

Subjects
HOT carriers, SILICON-on-insulator technology, METAL oxide semiconductor field-effect transistors
Abstract

Investigates hot-carrier effects (HCE) induced by the parasitic bipolar transistor (PBT) action in deep submicron N-channel silicon-on-insulator (SOI) metal oxide semiconductor field-effect transistors (MOSFET). Experimental details; Experimental results and numerical simulations; Conclusion.

Published
1998
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5. A Physically Based Relation Between Extracted Threshold Voltage and Surface Potential Flat-Band Voltage for MOSFET Compact Modeling.

Author

Benson, James, D'Halleweyn, Nele V., Redman-White, William, Easson, Craig A., Uren, Michael J., Faynot, Olivier, and Pelloie, Jean-Luc

Subjects
METAL oxide semiconductors, SEMICONDUCTORS, METAL oxide semiconductor field-effect transistors, FIELD-effect transistors
Abstract

Presents information on a study which established compact metal oxide semiconductor (MOS) models. Threshold voltage of a MOS field-effect transistors; Qualitative features of a threshold model; Experimental evaluation; Conclusion.

Published
2001
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6. Silicon-On-Insulator Technology Bumps Up SoC Performance.

Author

Pelloie, Jean-Luc and Auberton-Herve, Andre

Subjects
INTEGRATED circuits, SILICON-on-insulator technology, SYSTEMS on a chip, ELECTRONICS
Abstract

Features the innovative enhancements supportingsilicon-on-insulator (SOI) for systems-on-a-chip. Optimization ofSOI design processes and methodologies; Advantage in using SOI;Various features and characteristics of SOI. INSET: HIGHLIGHTS:.

Published
2003

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