6 results on '"Deimel M"'
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2. Combined instrument for the on-line investigation of plasma deposited or etched surfaces by monochromatized x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry.
3. Untersuchungen mit H-markierten Aminosäuren zur Proteinsynthese in der regenerierenden Rattenleber.
4. Quantification of molecular secondary ion mass spectrometry by internal standards.
5. Examination of organosilicon impregnating mixtures by static SIMS and diffuse reflectance FT-IR.
6. Analysis of Langmuir-Blodgett overlayers by time-of-flight secondary ion mass spectrometry (TOF-SIMS).
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