1. Carrier collection losses in interface passivated amorphous silicon thin-film solar cells.
- Author
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Neumüller, A., Bereznev, S., Ewert, M., Volobujeva, O., Sergeev, O., Falta, J., Vehse, M., and Agert, C.
- Subjects
SILICON films ,SOLAR cells ,AMORPHOUS silicon ,ARGON plasmas ,PHOTOELECTRON spectroscopy ,SURFACE photovoltage ,THERAPEUTICS - Abstract
In silicon thin-film solar cells the interface between the i- and p-layer is the most critical. In the case of back diffusion of photogenerated minority carriers to the i/p-interface, recombination occurs mainly on the defect states at the interface. To suppress this effect and to reduce recombination losses, hydrogen plasma treatment (HPT) is usually applied. As an alternative to using state of the art HPT we apply an argon plasma treatment (APT) before the p-layer deposition in n-i-p solar cells. To study the effect of APT, several investigations were applied to compare the results with HPT and no plasma treatment at the interface. Carrier collection losses in resulting solar cells were examined with spectral response measurements with and without bias voltage. To investigate single layers, surface photovoltage and X-ray photoelectron spectroscopy (XPS) measurements were conducted. The results with APT at the i/p-interface show a beneficial contribution to the carrier collection compared with HPT and no plasma treatment. Therefore, it can be concluded that APT reduces the recombination centers at the interface. Further, we demonstrate that carrier collection losses of thin-film solar cells are significantly lower with APT. [ABSTRACT FROM AUTHOR]
- Published
- 2016
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