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In this paper, the innovative photoluminescence imaging technique is described for applications to buried defect detection in silicon devices. The validity of this emerging technique is first assessed in comparison with well-established characterization techniques (defect selective etching of silicon, X-Ray diffraction topography, cross-sectional transmission electron microscopy imaging and photoluminescence spectroscopy). This paper then describes specific applications illustrating the use of the photoluminescence imaging technique for common processes of the CMOS semiconductor industry. The benefit of this fast, high resolution and non-destructive technique is demonstrated: this includes industrial use of the technique for in-line production control on product wafers. [ABSTRACT FROM AUTHOR]

After decades of intensive research, high-grade gliomas are still resistant to therapies, including surgery, chemotherapy, and radiotherapy or a combination thereof. The most important advance in the treatment of these tumors has been the introduction of a new chemotherapy drug called temozolomide, in combination with external beam photon irradiation [1]. One of the goals of the association of the CHU/UJF/INSERM and ESRF teams has been to develop research on synchrotron radiotherapy up to clinics. [ABSTRACT FROM AUTHOR]

Investigates the double-crystal diffraction imaging application to the magneto-acoustic vibration in FeBO[sub 3]. Visualization of the magneto-elastic coupling with Bragg diffraction imaging; Accounts of the observation on double-crystal monochromator; Variation of the lattice parameters.