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1. A Microwave Broadband Technique to Measure the Complex Resistivity of HTS Thin Films.

Author

Tosoratti, Nevio, Fastampa, Renato, Giura, Maurizio, Lenzi, Vasco, Sarti, Stefano, and Silva, Enrico

Subjects
HIGH temperature superconductors, SEMICONDUCTOR films, ELECTRIC properties of thin films, ELECTRIC resistance, ELECTRONICS
Abstract

Evaluates a microwave broadband technique to measure the complex electric resistivity of high temperature superconductor thin films. Extraction of film resistivity from measured reflection coefficients; Electromagnetic analysis of the coaxial circular transition structure; Coaxial line calibration.

Published
2001
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