1. Effects of capillary and van der Waals dispersion forces on the equilibrium profile of a wetting liquid: Theory and experiment.
- Author
-
Truong, Jack G. and Wayner, Peter C.
- Subjects
- *
VAN der Waals forces , *LIQUIDS , *INTERFEROMETRY , *ELLIPSOMETRY - Abstract
The equilibrium profile of a wetting liquid near the transition region, where both capillary and van der Waals dispersion forces are equally important, was determined using interferometry and ellipsometry. Measurements were made in the thickness range 0.02≤δ≤1 μm for both hexane and octane wetting a single crystal silicon surface. Theoretical profiles were also obtained numerically from a model based on the balance of hydrostatic force, capillarity, and the retarded van der Waals dispersion force. We used the Dzyaloshinskii–Lifshitz–Pitaevskii theory to calculate the van der Waals interactions between the alkanes and silicon. Fairly good agreements between the theoretical and experimental film profiles were obtained. The measured equilibrium film thicknesses for hexane and for octane on silicon were ∼250 and ∼195 Å, respectively. Both experimental and theoretical results indicate that hexane and octane wet and tend to form a zero contact angle with silicon. [ABSTRACT FROM AUTHOR]
- Published
- 1987
- Full Text
- View/download PDF