1. Electrical and optical characterization of 4H-SiC diodes for particle detection.
- Author
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Schifanoa, Ramón, Vinattieri, Anna, Bruzzi, Mara, Miglio, Stefania, Lagomarsino, Stefano, Sciortino, Silvio, and Nava, Filippo
- Abstract
The electronic and optical properties of several smedium to high qualityd 4H-SiC epitaxial sensors for particle detection have been studied. The samples are n-doped Schottky diodes with different nitrogen concentrations (6×1013 cm-3-5×1015 cm-3d and thicknesses (20-40 μm). A full electrical and optical characterization has been performed by capacitance versus voltage measurements and near-band-edge low-temperature photoluminescence. The effective doping along the epilayer and the depletion width have been determined and data are consistent with the charge collection efficiency characterization performed with a minimum ionizing μ-source. All the investigated samples exhibit a 100% collection efficiency. In particular, the best samples yield a highly reproducible signal, well separated from the pedestal. Photoluminescence results show a linear relationship between the effective doping and the ratio of nitrogen-bound excitonic emission (Q0) and free excitonic line (I76), in agreement with a previous work on 4H-SiC with a higher doping concentration fI. G. Ivanov, C. Hallin, A. Henry, O. Kordina, and E. Janzén, J. Appl. Phys. 80, 3504 s1996dg. Moreover we show that the dependence of the major spectral features as a function of the penetration depth of the exciting laser beam can quantitatively provide information on substrate contribution to the photoluminescence. In conclusion, we bring evidence that a detailed characterization of SiC-based detectors, by all optical techniques, yields an accurate value for the net doping and gives a qualitative information on the epilayer thickness prior to any electrical wafer tests. [ABSTRACT FROM AUTHOR]
- Published
- 2005
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