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Its recent adaptation to low-resolution mass spectra of polymers using fractional base units raises the question of the minimal resolution needed for a Kendrick mass defect (KMD) analysis. Intuiting an oligomeric resolution since the mass of a repeat unit is the sole value to be known, it is challenged by the relative failure of the KMD plots computed from an isotopically resolved matrix-assisted laser desorption ionization-time-of-flight (MALDI-TOF) mass spectrum to display clear alignments in the high mass range. Another procedure based on the remainders of Kendrick mass (RKMs) overcomes this pitfall with oligomers perfectly aligned in a new RKM plot. Despite a concomitant degradation of the resolving power and accuracy, with the example of MALDI-TOF/TOF mass spectra of a variety of homo- and copolymer ions, the RKM procedure still allows a rapid enumeration, assignment, and any further manipulation of all the product ion series in visual RKM plots. Successfully extended to the critical case of a MALDI mass spectrum recorded with a linear TOF analyzer allowing a bare oligomeric resolution, the RKM plot turns the distributions differing by their end-groups or adducted ion into clear horizontal lines. It eventually gives intuition its due by answering the original question: the minimal resolution required for a mass defect analysis can be as low as oligomeric with the appropriate formulas. [ABSTRACT FROM AUTHOR]