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This paper presents a fully integrated on-chip switched-capacitor (SC) DC-DC converter that supports a programmable regulated power supply ranging from 2.6 to 3.2 V out of a 5 V input supply. The proposed 4-to-3 step-down topology utilizes two conventional 2-to-1 step-down topologies; each of them (2-to-1_up and 2-to-1_dw) has a different flying capacitance to maximize the load current driving capability while minimizing the bottom-plate capacitance loss. The control circuits use a low power supply provided by a small internal low-drop output (LDO) connected to the internal load voltage (VL_dw) from the 2-to-1_dw, and low swing level-shifted gate-driving signals are generated using the internal load voltage (VL_dw). Therefore, the proposed implementation reduces control circuit and switching power consumptions. The programmable power supply voltage is regulated by means of a pulse frequency modulation (PFM) technique with the compensated two-stage operational transconductance amplifier (OTA) and the current-starved voltage controlled oscillator (VCO) to maintain high efficiency over a wide range of load currents. The proposed on-chip SC DC-DC converter is designed and simulated using high-voltage 0.35 μm bipolar, complementary metal-oxide-semiconductor (CMOS) and DMOS (BCDMOS) technology. It achieves a peak efficiency of 74% when delivering an 8 mA load current at a 3.2 V supply voltage level, and it provides a maximum output power of 48 mW (IL = 15 mA at VL_up = 3.2 V) at 70.5% efficiency. The proposed on-chip SC voltage regulator shows better efficiency than the ideal linear regulator over a wide range of output power, from 2.6 mW to 48 mW. The 18-phase interleaving technique enables the worst-case output voltage ripple to be less than 5.77% of the load voltage. [ABSTRACT FROM AUTHOR]

This paper presents a novel statistical characterization for accurate timing and a new probabilistic-based analysis for estimating the leakage power in partially depleted silicon-on-insulator (PD-SOI) circuits in 100-nm BSIMSOI3.2 technology. This paper shows that the accuracy of modeling the leakage current in PD-SOI complementary metal-oxide-semiconductor (CMOS) circuits is improved by considering the interactions between the subthreshold leakage and the gate tunneling leakage, the stacking effect, the history effect, and the fan-out effect, along with a new input-independent method for estimating the leakage power based on a probabilistic approach. The proposed timing and leakage power estimate algorithms are implemented in MATLAB, HSPICE, and C. The proposed methodology is applied to ISCAS85 benchmarks, and the results show that the error is within 5%, compared with random simulation results. [ABSTRACT FROM AUTHOR]