1. Fast time-domain characterization of finite size microstrip structures.
- Author
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Aygün, K., Shanker, B., and Michielssen, E.
- Subjects
- *
ELECTROMAGNETISM , *ELECTRIC transients , *STRIP transmission lines , *DIELECTRICS , *TIME-domain analysis , *INTEGRAL equations - Abstract
A new fast integral-equation-based scheme for analysing electromagnetic transients on finite size microstrip structures is described. The scheme permits the analysis of structures comprised of perfect electrically conducting surfaces and wires along with lossless but potentially inhomogeneous dielectric regions. For typical microstrip structures, the computational complexity of the proposed analysis tool grows as O(NtNsv log2Nsv), where Nt denotes the number of time steps in the analysis, Nsv = Ns + Nv, and Ns and Nv represent the number of spatial unknowns that model currents on conducting surfaces/wires/junctions and in penetrable volumes, respectively. This complexity estimate is in stark contrast with that for classical marching-on-in-time solvers, which require O(NtNsv2) CPU resources. Copyright © 2002 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]
- Published
- 2002
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