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This article describes a new charged-particle track fitting algorithm designed for use in high-speed electronics applications such as hardware-based triggers in high-energy physics experiments. Following a novel technique designed for fast electronics, the positions of the hits on the detector are transformed before being passed to a linearized track parameter fit. This transformation results in fitted track parameters with a very linear dependence on the hit positions. The approach is demonstrated in a representative detector geometry based on the CMS detector at the Large Hadron Collider. The fit is implemented in FPGA chips and optimized for track fitting throughput and obtains excellent track parameter performance. Such an algorithm is potentially useful in any high-speed track-fitting application. [ABSTRACT FROM AUTHOR]

Abstract: LHCb is the dedicated b-physics experiment of the LHC. Its vertex detector, the VErtex LOcator (VELO), will operate in a harsh radiation environment with limited access due to its proximity to the LHC beam. To ensure the long term operation and performance, every module was required to pass a set of quality assurance tests. These were specifically developed for the VELO modules to take into account their operational environment and assembly steps. Each VELO module was rigorously inspected, tested and thermally cycled in the Glasgow module burn-in procedures. This paper provides details of the burn-in procedures and summarises the main results that were found. Some of the major results presented in this paper are: the full characterisation of the leakage currents; identification of bad channels; and signal to noise measurements. A few minor problems were identified through visual inspections of the modules and the feedback into the production process proved critical. As a result of the electrical and thermal tests, one module out of the 45 that were tested was rejected due to its thermal performance. Studies are also reported, based on individual modules, characterising the front end read out chip pulse shape. [Copyright &y& Elsevier]