1. Surface‐enhanced Raman scattering as a tool to study cationic surfactants exhibiting low critical micelle concentration.
- Author
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Mathioudakis, George N., Soto Beobide, Amaia, Bokias, Georgios, Koutsoukos, Petros G., and Voyiatzis, George A.
- Subjects
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CRITICAL micelle concentration , *RAMAN scattering , *SURFACE enhanced Raman effect , *CATIONIC surfactants , *ELECTRICAL conductivity measurement , *SILVER nanoparticles , *BENZALKONIUM chloride - Abstract
The collection of surface‐enhanced Raman scattering (SERS) by silver nanocolloids was used to identify the critical micelle concentration (CMC) of three cationic surfactants in 0.5‐M NaCl solutions: hexadecyltrimethylammonium bromide, dodecyltrimethylammonium bromide, and benzalkonium chloride. Despite structural similarity between the three test surfactans, differences of the shape and size of the respective micelles affected the corresponding SERS signals. The CMC values determined by this method agreed with the respective values measured by conventional methods, including fluorescence probing and electrical conductivity measurements. The potential for the application of SERS technique for low CMC determination without surface modification of silver nanoparticles by a Raman‐active molecule was also demonstrated. [ABSTRACT FROM AUTHOR]
- Published
- 2020
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