1. Ecosystem Resistance and Resilience after Dry and Wet Events across Central Asia Based on Remote Sensing Data.
- Author
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Zou, Jie, Ding, Jianli, Huang, Shuai, and Liu, Bohua
- Subjects
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SHRUBLANDS , *DROUGHTS , *MODIS (Spectroradiometer) , *ECOLOGICAL resilience , *CLIMATE change forecasts , *EXTREME weather , *REMOTE sensing - Abstract
Climate change forecasts indicate that the frequency and intensity of extreme climate events will increase in the future; these changes will have important effects on ecosystem stability and function. An important arid region of the world, Central Asia has ecosystems that are extremely vulnerable to extreme weather events. However, few studies have investigated the resistance and resilience of this region's ecosystems to extreme weather events. In this study, first, the extreme drought/wet threshold was calculated based on the 113-year (1901–2013) standardized precipitation–evapotranspiration index (SPEI); second, moderate resolution imaging spectroradiometer (MODIS) remote sensing data were applied to calculate ecosystem water use efficiency (WUE) and quantify ecosystem resistance and resilience after different extreme climate events; and finally, differences in the changes of various ecosystem types before and after climate events were assessed. The results showed the following: (1) The average SPEI was 0.073, and the thresholds of extreme wetness and drought were 0.91 and −0.67, respectively. Central Asia experienced extreme wet periods in 2002 and 2003 and a drought period in 2008. (2) Suitable wetness levels can increase the resistance of an ecosystem; however, continuous wetness reduces ecosystem resistance, as does drought. Wet areas had strong resilience after wet events, and arid areas had strong resilience after drought events. (3) During both wet and drought years, the transition between shrubland and grassland caused changes in ecosystem resistance and resilience. These findings are important for understanding the impact of future climate change on ecosystem stability. [ABSTRACT FROM AUTHOR]
- Published
- 2023
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