Search

In Cu2ZnSnS4 (CZTS) solar cells, it is crucial to suppress the generation of and remove the SnS2 secondary phase to improve the solar cell characteristics, as the SnS2 secondary phase affects the barrier for carrier collection and diode characteristics of the device. In this study, the nano-metallic precursor was modified to effectively suppress the generation of the SnS2 secondary phase on the surface and simultaneously improve the uniformity and quality of the thin film. The CZTS bifacial solar cells prepared via the proposed method exhibited significantly improved junction-rectifying characteristics, as the efficiency was improved to 1.59%. The proposed method to figurremove SnS2 is effective, simple, and environmentally friendly. [ABSTRACT FROM AUTHOR]

• The investigation of the defect-related carrier dynamics of CZTSe conducted in this study provided the experimental characterization of the existence of [2Cu Zn − + Sn Zn 2+] defect clusters. From the results, it is important to consider the possibility of factors such as the presence of [2Cu Zn − + Sn Zn 2+] defect clusters when determining the source of the performance degradation of CZTSe solar cells. In this work, a systematic investigation of the effects of point defects on the efficiency of a Cu 2 ZnSnSe 4 (CZTSe) thin film solar cell was conducted using temperature-/power-dependent photoluminescence (PL) and time-resolved photo-luminescence (TRPL). The studied stoichiometric CZTSe absorber layer for a CZTSe solar cell with an efficiency of 4.4 % was prepared using the low-toxicity selenization process. The fitting to the Arrhenius plot and the stretched tail at the long-wavelength side of PL spectrum obtained at 10 K indicated a high concentration of zinc on copper (Cu Zn) point defects. The dispersive-photon-energy-dependent TRPL at 10 K exhibited non-exponential stretched PL decay at all photon energies and, in particular, revealed the highly fluctuating potential of CZTSe that caused carrier localization. This effect was observed to be caused by [2Cu Zn − + Sn Zn 2+] defect clusters, which produce a significant conduction/valence band-edge shift in their vicinity in CZTSe and can cause shunt leakage and an increase in series resistance. This systematic investigation presents the experimental characterization of [2Cu Zn − + Sn Zn 2+] defect clusters and provides perspective to help clarify the performance deterioration of CZTSe solar cells. [ABSTRACT FROM AUTHOR]