1. Trap Limited Charge Transport In GexSe80-xPb20 Films.
- Author
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Kumar, Kamal, Purohit, L. P., Kumar, R., and Mehra, R. M.
- Subjects
- *
CHARGE transfer , *LEAD alloys , *METAL ions , *THIN films , *TRANSPORT properties of metal , *DISTRIBUTION (Probability theory) , *STABILITY (Mechanics) - Abstract
Charge transport and trap density distribution of glassy GexSe80-xPb20 films have been investigated as a function of temperature and voltage. From room temperature to 220 K, space charge limited current, with an exponential distribution of trapping states, dominates the conduction mechanism. Below 220 K, mobility of charge carriers becomes field dependent. The characteristic energy of trap distribution and its density minimizes at x = 20 which reveals the high structural stability of Ge20Se60Pb20 glass. [ABSTRACT FROM AUTHOR]
- Published
- 2011
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