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A bent-crystal Laue {or Cauchois [J. Phys. Radium 3, 320 (1932)] geometry} spectrograph is a good compromise between sensitivity and spectral resolution for measuring x-ray spectra (15

We have newly developed an x-ray photoemission electron microscope (XPEEM) which uses both soft x-rays and hard x-rays at the undulator beam line BL15XU in the synchrotron radiation (SR) facility SPring-8 to observe various practical materials. In combination with an energy analyzer and high brilliant x-ray source, the detection of high kinetic energy inner-shell photoelectrons is essential for revealing the chemical properties of specimen subsurfaces or buried interfaces, owing to long inelastic mean free path of the high kinetic energy photoelectrons. The most significant result in our design is the new combined electric and magnetic field objective lens in which the magnetic field penetrates up to the sample surface. This allows the measurement with high spatial resolution of both low intensity images of inner-shell photoelectrons with high kinetic energy and high intensity images of secondary electrons. By using the sample bias scan method, we can easily change the focus condition of the objective lens in order to allow the energy filtered imaging with photoelectrons having the kinetic energy in a wide range (1–10 000 eV). By the combination of high brilliant SR x-rays, the new objective lens, and sample bias method, our XPEEM can successfully obtain the microarea x-ray photoelectron spectra and energy filtered XPEEM images of inner-shell photoelectrons, such as Si 1s, without any surface cleaning procedure. The energy filtered XPEEM image using photoelectrons from deep inner shells, Si 1s, was obtained for the first time. [ABSTRACT FROM AUTHOR]

A simple computational method is proposed for estimating the time-dependent flux F[ΔE](t) of an x-ray spectrum S(E,t) over domain [ΔE] from data Dk(t)(k=1,...,N) obtained by an N-channel array of filtered detectors. It is assumed that the data are related to the spectrum by a discrete, inhomogeneous, first-kind Fredholm integral equation Dk=∫S(E,t)Rk(E)dE, where Rk(E) is the known response function for each detector channel of the diagnostic. The proposed method constructs a spectral sensitivity HLS(E) for the diagnostic array as a linear combination ∑k=1NakRk(E) of the responses, where the coefficients ak are obtained by a least-squares criterion plus a constraint. The ak values, once determined, apply as long as the responses are valid. The flux estimate is then simply FLS(t)=∑k=1NakDk(t), without a spectral unfold of the data. The method is useful for quick analyses of time-dependent data, for comparisons with other flux-measuring diagnostics, and for the experimental design of filtered-detector arrays. The method is applied to a five-channel array of filtered photoemissive x-ray detectors [G. A. Chandler et al., Rev. Sci. Instrum. 70, 561 (1999)], used for z-pinch measurements at the Z-accelerator facility [R. B. Spielman et al., Phys. Plasmas 5, 2105 (1998)]. Comparisons with unfold results are made, and a first-order analysis of error propagation into FLS(t) is presented. [ABSTRACT FROM AUTHOR]

At the High Energy Beamline ID15A at the European Synchrotron Radiation Facility we have developed a fast three-dimensional x-ray microtomography system, which acquires a complete dataset in typically less than 10 s. This unprecedented speed is achieved by combining a high efficiency phosphor screen, a reflecting microscope objective and a fast charge coupled device detector with the very intense high-energy white beam radiation provided by a wiggler source. The achieved spatial resolution is 2 μm. The available x-ray energy spectrum spans from 20 to 250 keV and can therefore be used for low and high Z materials. The spectrum can be modified by inserting different filters into the x-ray beam in order to optimize the signal-to-noise ratio and to avoid beam-hardening artifacts. Different phosphors with different energy sensitivity can be used. The very high speed allows in situ studies of systems evolving on the time scale of a few seconds or minutes. Three examples are given on sintering of metallic powders, solidification of binary alloys and liquid front propagation in granular materials. [ABSTRACT FROM AUTHOR]

X-ray absorption spectroscopy (XAS) in the intermediate x-ray region (2–6 keV) for dilute biological samples has been limited because of detector/flux limitations and inadequate cryogenic instrumentation. We have designed and constructed a new tailpiece/sample chamber for a commercially available liquid helium cooled cryostat which overcomes difficulties related to low fluorescence signals by using thin window materials and incorporating an internal photodiode detector. With the apparatus, XAS data at the Cl, S, and Ca K edges have been collected on frozen solutions and biological samples at temperatures down to 60 K. A separate chamber has been incorporated for collecting room-temperature spectra of standard compounds (for energy calibration purposes) which prevents contamination of the cryostat chamber and allows the sample to remain undisturbed, both important concerns for studying dilute and radiation-sensitive samples. © 2004 American Institute of Physics. [ABSTRACT FROM AUTHOR]