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Exploration of mass-selected clusters by soft x-ray synchrotron radiation is well suited to receive element specific information on clusters in contact with a support and to systematically follow the evolution of size-dependent electronic and geometrical properties from the smallest clusters toward the bulk. Here we describe an experimental setup, which combines cluster synthesis, mass selection, soft landing, ultrahigh vacuum transfer, and photoionization experiments such as x-ray photoelectron spectroscopy, x-ray absorption, and Auger electron spectroscopy. First spectroscopic results and experimental conditions are briefly discussed for Cu19 deposited onto the natural oxide layer of a Si-wafer surface. [ABSTRACT FROM AUTHOR]