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Your search keyword '"SCANNING electron microscopes"' showing total 5 results
Start Over Descriptor "SCANNING electron microscopes" Publication Type Periodicals Publication Type Reviews Journal drug discovery & development Database Academic Search Index
5 results on '"SCANNING electron microscopes"'

1. When Size & Shape Matter.

Author

Lich, Ben and Willen, Ulf

Subjects
*SCANNING electron microscopes, *OPTICAL instruments, *PARTICLES (Nuclear physics), *BIOPHARMACEUTICS, *MEDICAL research
Abstract

The article presents an analysis on the scanning electron microscope (SEM)-based systems used by researchers to examine the sub-micron pharmaceutical particles. It states that the SEM image-based particle analysis has provided more qualitative and quantitative capabilities for nanoscale particles compared to the optical microscopy. Moreover, it notes that the system captures critical shape information unavailable from scattering and diffraction techniques.

Published
2009

2. NEW TECHNOLOGIES.

Subjects
*MEDICAL equipment, *SCANNING electron microscopes, *MASS spectrometers, *IMAGING systems, *EVALUATION
Abstract

The article evaluates several medical instruments and apparatus including, benchtop scanning electron microscope, NeoScope from Nikon Instruments and JEOL, Qq-TOF mass spectrometer from Bruker Daltonics, and BioSpectrum 800 Imaging System from UVP LLC.

Published
2008

3. NEW TECHNOLOGIES.

Subjects
*DRUG development, *SCANNING electron microscopes, *APPLICATION software, *EQUIPMENT & supplies
Abstract

The article provides information on drug discovery and development technologies including Berthold Technologies GmbH & Co. KG's second generation TriStar2multilabel microplate reader, JEOL USA Inc.'s NeoScope benchtop scanning electron microscope (SEM) and Quintiles' Allume market entry software.

Published
2012

4. Scanning Electron Microscope.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the Magellan extreme resolution scanning electron microscope (SEM) from FEI Co.

Published
2010

5. Thermal Field Emission Analytical SEM.

Subjects
*SCANNING electron microscopes, *EVALUATION
Abstract

The article evaluates the JSM-7001F thermal field emission analytical scanning electron microscope from Japan Electron Optics Laboratory.

Published
2007

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