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In this paper, a theoretical model is established to describe the effect of nanoscale amorphization in nanocrystalline bimaterials on the dislocation emission from the tip of a collinear crack at the interface. In the description, nanoscale amorphization is formed by the splitting transition of the Grain Boundary (GB, the disclination of GBs caused by the movement of GBs). The analytical solution of the model is obtained by the elasticity complex potential solution method. In addition, the effects of nanoscale amorphization, dislocation emission angle, interfacial crack length and material constants of nanocrystalline bimaterials on the critical stress intensity factor of interfacial crack tip corresponding to dislocation emission are discussed through numerical analysis. The analysis shows that the influence of nanoscale amorphization in nanocrystalline bimaterials on the critical stress intensity factor (SIF) corresponding to dislocation emission depends on the dislocation emission angle, the position and size of the nanoscale amorphization, interface crack length and relative shear modulus. With the increase in relative shear modulus and dislocation emission angle, the normalized critical SIF decreases at first and increases afterwards. When the nanoscale amorphization size is small, the critical SIF of the dislocation is less affected, but when the size is larger, the impact becomes great. The influence of nanoscale amorphization on the dislocation emission from collinear interface crack tip is related to nanoscale amorphization and relative shear modulus. There is a critical relative shear modulus that the increase in dislocation intensity has little effect on dislocation emission. Appropriate selection of materials for the upper and lower planes can reduce the critical stress intensity factor corresponding to dislocation emission, thereby promoting the dislocation emission from interface cracks and improving the toughness of the nanocrystalline bimaterials. [ABSTRACT FROM AUTHOR]