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This book covers key topics in the emerging field of plasmonic MEMS, with an emphasis on practical aspects. Although readers can find many comprehensive textbooks on electromagnetic waves, nanophotonics and plasmonics, most of these lack the focus needed for a thorough grasp of plasmonic micromachining and MEMS.This book introduces the main framework of plasmonic MEMS, providing an overview of introductory concepts, a thorough description of the basic foundations, along with the state-of-the-art and existing challenges. The author presents an abbreviated overview of the basic physics and devices related to electromagnetic waves and surface plasmons. Additional coverage includes recent advances in the fabrication of sub-100-nm patterns on micro scale devices and structures and a review of emerging techniques in the fabrication of plasmonic systems. A comprehensive and historical review of the current advances in the area of plasmonic nanofabrication is also included.This book focuses on an appealing and distinctive aspect of plasmonics, as a tool for patterning and the fabrication of ultra-fine resolution structures. The author reviews the recent developments in plasmonic MEMS and microsystems for biosensing applications, including refractive-index based label-free biosensing, plasmonic integrated lab-on-chip systems, plasmonic for near-field scanning optical microscopy (NSOM) and plasmonics on-chip system for cellular imaging.

Our civilization owes its most significant milestones to our use of materials. Metals gave us better agriculture and eventually the industrial revolution, silicon gave us the digital revolution, and we're just beginning to see what nanomaterials yield. Updated to reflect the many societal and technological changes in the field since publication of the first edition, Introduction to Materials Science and Engineering, Second Edition, offers an interdisciplinary view that emphasizes the importance of materials to engineering applications and builds the basis needed to select, modify, and create materials to meet specific criteria. The most outstanding feature of this book is the authors'unique and engaging application-oriented approach. By beginning each chapter with a real-life example, an experiment, or interesting facts, the authors wield an expertly crafted treatment that entertains and motivates as much as informs and educates. The discipline is linked to modern developments, such as semiconductor devices, nanomaterials, and thin films, while working systematically from atomic bonding and analytical methods to crystalline, electronic, mechanical, and magnetic properties as well as ceramics, polymers, corrosion, and phase diagrams.Updates in the Second Edition References to advances in the field, including computational thermodynamics, allowing computation of phase diagrams with great accuracy and new materials Updated applications and technologies, such as electric vehicles and the use of magnetic fields as a processing tool Revised, practical end-of-chapter problems that go beyond traditional plug-and-chug exercises to enhance learning More examples with detailed solutions in each chapter A new chapter highlighting how materials can impact four United Nations Sustainable Development Goals This book is written for undergraduate students and readers interested in introductory materials science and engineering concepts. This concise textbook provides a strong foundation in materials science engineering and its applications. A solutions manual and PowerPoint lecture slides are available for adopting professors.

In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging. High-resolution imaging has cont- ued to develop with a more thorough understanding of how secondary el- trons are generated. The?eld emission gun SEM, with its high brightness, advanced electron optics, which minimizes lens aberrations to yield an - fective nanometer-scale beam, and “through-the-lens” detector to enhance the measurement of primary-beam-excited secondary electrons, has made high-resolution imaging the rule rather than the exception. Methods of x-ray analysis have evolved allowing for better measurement of specimens with complex morphology: multiple thin layers of different compositions, and rough specimens and particles. Digital mapping has transformed classic x-ray area scanning, a purely qualitative technique, into fully quantitative compositional mapping.

Bringing together experts from 15 countries, this book is based on the lectures and contributions of the NATO Advanced Study Institute on “Nanotechnological Basis for Advanced Sensors” held in Sozopol, Bulgaria, 30 May - 11 June, 2010. It gives a broad overview on this topic, and includes articles on: techniques for preparation and characterization of sensor materials; different types of nanoscaled materials for sensor applications, addressing both their structure (nanoparticles, nanocomposites, nanostructured films, etc.) and chemical nature (carbon-based, oxides, glasses, etc.); and on advanced sensors that exploit nanoscience and nanotechnology. In addition, the volume represents an interdisciplinary approach with authors coming from diverse fields such as physics, chemistry, engineering, materials science and biology. A particular strength of the book is its combination of longer papers, introducing the basic knowledge on a certain topic, and brief contributions highlighting special types of sensors and sensor materials.

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Our civilization owes its most significant milestones to our use of materials. Metals gave us better agriculture and eventually the industrial revolution, silicon gave us the digital revolution, and we're just beginning to see what carbon nanotubes will give us. Taking a fresh, interdisciplinary look at the field, Introduction to Materials Scien