1. Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials
- Author
-
Otwin Breitenstein, Wilhelm Warta, Martin C. Schubert, Otwin Breitenstein, Wilhelm Warta, and Martin C. Schubert
- Subjects
- Thermography, Semiconductors--Thermal properties, Electronic apparatus and appliances--Thermal properties, Electronic apparatus and appliances--Testing
- Abstract
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
- Published
- 2019