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Your search keyword '"V. N. Golubev"' showing total 4 results
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4 results on '"V. N. Golubev"'

1. Functional Materials Technology and Industry Forum IX

Author

Xiao Lang Chen, Xin Li Guo, Xiao Long Lu, Xiao Lang Chen, Xin Li Guo, and Xiao Long Lu

Subjects
Nanostructured materials--Congresses, Materials science--Congresses
Abstract

9th China Functional Material Technology and Industry Forum (9th CFMTIF 2017)Selected, peer reviewed papers from the 9th China Functional Materials Technology and Industry Forum (9th CEMTIF 2017), August 18-21, 2017, Yinchuan, China

Published
2018

2. Advances in Materials Science Research

Author

Wythers, Maryann C. and Wythers, Maryann C.

Subjects
Materials science
Abstract

Materials science encompasses four classes of materials, the study of each of which may be considered a separate field: metals, ceramics, polymers and composites. This volume gathers important research from around the globe in this dynamic field including research on the fabrication, properties and thermal stability of quasi-amorphous Ta-Si-N diffusion barriers; sol-gel immobilized microorganisms for bioremediation systems and biosensors; glass-ceramics with oriented nonlinear crystals; plastic based nanocomposite films for active packaging with tailor diffusion properties; thermal barrier coated superalloys used in turbine blades and using feldspar to produce ceramic floor tiles. (Imprint: Nova)

Published
2012

3. THERMEC 2009

Author

T. Chandra, N. Wanderka, W. Reimers, M. Ionescu, T. Chandra, N. Wanderka, W. Reimers, and M. Ionescu

Subjects
Composite materials--Congresses, Materials--Congresses
Abstract

THERMEC 2009, 6th International Conference on PROCESSING & MANUFACTURING OF ADVANCED MATERIALS, Berlin, Germany, August 25-29, 2009

Published
2010

4. Microscopy of Semiconducting Materials : 1999 Proceedings of the Institute of Physics Conference Held 22-25 March 1999, University of Oxford, UK

Author

A.G Cullis, R Beanland, A.G Cullis, and R Beanland

Subjects
High resolution electron microscopy--Congresses, Semiconductors--Surfaces--Congresses, Materials--Microscopy--Congresses, Epitaxy--Congresses
Abstract

With IC technology continuing to advance, the analysis of very small structures remains critically important. Microscopy of Semiconducting Materials provides an overview of advances in semiconductor studies using microscopy. The book explores the use of transmission and scanning electron microscopy, ultrafine electron probes, and EELS to investigat

Published
1999

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