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Volume 36 provides an extensive introduction to magnetic imaging,including theory and practice, utilizing a wide range of magnetic sensitive imaging methods. It also illustrates the applications of these modern experimental techniques together with imaging calculations to today's advanced magnetic materials. This book is geared towards the upper-level undergraduate students and entry-level graduate students majoring in physics or materials science who are interested in magnetic structure and magnetic imaging. Researchers involved in studying magnetic materials should alsofind the book useful as it consistently summarizes the recent progress in this field. The book covers today's most advanced magnetic imaging techniques, comprehensively written with about 150 figures and more than 300 references to the scientific literature

In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. They predicted that three to five might be sold in the first year a commercial SEM was available, and that ten instruments would saturate the marketplace. In 1964, the Cambridge Instruments Stereoscan was introduced into the United States and, in the following decade, over 1200 scanning electron microscopes were sold in the U. S. alone, representing an investment conservatively estimated at $50,000- $100,000 each. Why were the market surveyers wrongil Perhaps because they asked the wrong persons, such as electron microscopists who were using the highly developed transmission electron microscopes of the day, with resolutions from 5-10 A. These scientists could see little application for a microscope that was useful for looking at surfaces with a resolution of only (then) about 200 A. Since that time, many scientists have learned to appreciate that information content in an image may be of more importance than resolution per se. The SEM, with its large depth of field and easily that often require little or no sample prepara­ interpreted images of samples tion for viewing, is capable of providing significant information about rough samples at magnifications ranging from 50 X to 100,000 X. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.