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Image processing and a major contribution on microscopy dominate the latest volume of these advances. This volume looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and applying them to realistic practical situations.Addressing and solving daily issues faced by researchers, consultants and engineers working in this field, makes this book essential reading•Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics•Emphasises theory and it's application in a practical sense•Provides the FIRST full statement of a radical new approach to'phase calibration'and the solution of this important and difficult problem, pioneered by A, Lannes

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Information systems with an abundance of graphics data are growing rapidly due to advances in data storage technology, the development of multimedia communications across networks, and the fact that parallel computers are leading to faster image processing systems. This book addresses image information retrieval and spatial reasoning using an approach called Symbolic Projection, which supports descriptions of the image content on the basis of the spatial relationships between the pictorial objects. Image information systems have a wide variety of applications, including information retrieval on the World Wide Web, medical pictorial archiving, computer-aided design, robotics, and geographical information systems, and this book is comprehensively illustrated with examples from these areas. Symbolic Projection now forms the basis of an enormous number and range of information retrieval algorithms, and also supports query-by-picture and qualitative spatial reasoning. Both authors are international experts in the field, and the book will serve as an excellent source for those working in multimedia systems and image information systems who wish to find out more about this exciting area. An all-inclusive source to the field--all you need to know S-K. Chang is the leading authority in this field, which he pioneered Includes a wide variety of applications, including information retrieval on the World Wide Web, computer-aided design, and geographical information systems

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles onthe physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Academic Press is pleased to announce the creation of Advances in Imaging and Electron Physics. This serial publication results from the merger of two long running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. Advances in Imaging & Electron Physics will feature extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies,microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Continuation order customers for either of the original Advances will receiveVolume 90, the first combined volume.

Academic Press is pleased to announce the creation of Advances in Imaging and Electron Physics. This serial publication results from the merger of two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. Advances in Imaging & Electron Physics will feature extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies,microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.