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This book looks at the application of cascaded interferometers in both theoretical and practical contexts, particularly focusing on enhancing image contrast and facilitating medical diagnostics. Commencing with a comprehensive exploration of modulated two-beam interference employing Fourier optics, it progresses to discuss the implementation of a cascaded Michelson interferometer, with a specialized emphasis on its utility in analyzing microscopic structures such as glass fibers. Subsequent chapters examine step-index fibers using multiple laser beam interferometry and introduce sophisticated models for interpreting fringe shifts in unclad glass fibers through ordinary multiple-beam interference. Moreover, the book addresses the recognition of modulated apertures employing a Cascaded Fabry-Perot Interferometer (CFPI) and discusses its implications for various applications. It looks at the processing of retinal artery images leveraging higher orders of two-beam interference and investigates the utility of cascaded interferometric techniques in examining kidney and colon images. Furthermore, it presents a novel approach to image processing of coronaviruses utilizing interferometry techniques, showcasing the potential of interferometric methods in medical research and diagnostics. Through its systematic exploration of cascaded interferometers and their diverse applications, this book is suited for researchers, practitioners, and students alike, offering insights into both fundamental principles and advanced methodologies in interferometry and medical imaging.

This book covers speckle image formation using a variety of modulated apertures. The central theme revolves around theoretical analyses, specifically the calculation of impulse responses or Point Spread Functions (PSFs) corresponding to these apertures. These calculations provide crucial insights into the resolution inherent in the resulting speckle images. The book begins with an examination of the recognition of the direction of new apertures from elongated speckle images, setting the stage for subsequent discussions. The theoretical analyses extend to diverse aperture designs, including Gaussian, graded-index, and modulated apertures. The book delves into the nuanced dynamics of contrast in speckle images, exploring the Voigt distribution and the effects of modulation on contrast. In addition to aperture-centric discussions, the book addresses the processing of the formed speckle images. The chapters impart a comprehensive understanding of speckle imaging, encompassing discrimination in microscopy using digital speckle images, the utilization of concentric hexagonal pupils, and the exploration of irregular apertures. The book culminates in a detailed exploration of speckle imaging in the context of an annular Hermite Gaussian laser beam. Overall, this book serves as a valuable resource for researchers and academics seeking a profound exploration of speckle image formation, modulation, and processing across a spectrum of apertures and theoretical frameworks.

Image processing and a major contribution on microscopy dominate the latest volume of these advances. This volume looks at theory and it's application in a practical sense, with a full account of the methods used and realistic detailed application. The authors do this by examining the latest developments, historic illustrations and mathematical fundamentals of the exciting developments in imaging and applying them to realistic practical situations.Addressing and solving daily issues faced by researchers, consultants and engineers working in this field, makes this book essential reading•Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics•Emphasises theory and it's application in a practical sense•Provides the FIRST full statement of a radical new approach to'phase calibration'and the solution of this important and difficult problem, pioneered by A, Lannes

The subjects reviewed in the Advances in Imaging and Electron Physics series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading. Emphasizes broad and in depth article collaborations between world-renowned scientists in the field of image and electron physics Presents theory and it's application in a practical sense, providing long awaited solutions and new findings Provides a comprehensive overview of international congress proceedings and associated publications, as source material

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Optical Signal Processing is a collection of synopses of the works of many experts in the different fields of optical signal processing. The book also includes systems or algorithms that have been successfully tried and used. The monograph is divided into seven parts. Part I discusses color image processing and white-light Fourier transformations, while Part II covers topics related to pattern recognition such as optical feature extraction and unconventional correlators. Part III deals with temporal signal processing and its related optical architectures, acoustooptic synthetic aperture radar processors, and acoustooptic signal processors. Part IV tackles nonlinear optical processors and waveguide devices. Part V discusses optical and tomographic transformation. Part VI deals with optical numeric processing, optical linear algebra processors, and related algorithm and software. Part VII talks about devices and components and their applications such as fiber-optic delay-line signal processors and spatial light modulators. The text is recommended for engineers and scientists in the field of optical signal processing, especially those who would like to know more of its advancements.

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. It features extended articles onthe physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Academic Press is pleased to announce the creation of Advances in Imaging and Electron Physics. This serial publication results from the merger of two long running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. Advances in Imaging & Electron Physics will feature extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies,microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Continuation order customers for either of the original Advances will receiveVolume 90, the first combined volume.

Academic Press is pleased to announce the creation of Advances in Imaging and Electron Physics. This serial publication results from the merger of two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. Advances in Imaging & Electron Physics will feature extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies,microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.