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1. Advanced Measurement and Test

Author

Riza Esa, Yan Wen Wu, Riza Esa, and Yan Wen Wu

Subjects
Electronics--Testing--Congresses, Materials--Testing--Congresses
Abstract

Selected, peer reviewed paper from 2011 2nd International Conference on Advanced Measurement and Test (AMT 2011) on June 24-26, 2011, Nanchang, China

Published
2011

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