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1. ISTFA 2011 : Conference Proceedings From the 37th International Symposium for Testing and Failure Analysis, November 13-17, 2011, San Jose Convention Center, San Jose, California

Author

ASM International, International Symposium for Testing and Failure Analysis/2011, Electronic Device Failure Analysis Society, ASM International, International Symposium for Testing and Failure Analysis/2011, and Electronic Device Failure Analysis Society

Subjects
Electronics--Materials--Testing--Congresses, Electronic apparatus and appliances--Testing--Congresses
Abstract

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.

Published
2011

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