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1. Resonant X-Ray Scattering in Correlated Systems

Author

Youichi Murakami, Sumio Ishihara, Youichi Murakami, and Sumio Ishihara

Subjects
Condensed matter, Materials—Analysis, Spectrum analysis, Microtechnology, Microelectromechanical systems
Abstract

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides. Finally the observation of multipole orderings with x-ray diffraction is shown.

Published
2016

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