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The generalization error bounds found by current error models using the number of effective parameters of a classifier and the number of training samples are usually very loose. These bounds are intended for the entire input space. However, support vector machine (SVM), radial basis function neural network (RBFNN), and multilayer perceptron neural network (MLPNN) are local learning machines for solving problems and treat unseen samples near the training samples to be more important. In this paper, we propose a localized generalization error model which bounds from above the generalization error within a neighborhood of the training samples using stochastic sensitivity measure. It is then used to develop an architecture selection technique for a classifier with maximal coverage of unseen samples by specifying a generalization error threshold. Experiments using 17 University of California at Irvine (UCI) data sets show that, in comparison with cross validation (CV), sequential learning, and two other ad hoc methods, our technique consistently yields the best testing classification accuracy with fewer hidden neurons and less training time. [ABSTRACT FROM AUTHOR]

The Third International Conference on Data Engineering was held in Los Angeles, California on February 2 to 6, 1987. The conference was designed as an international forum for bringing together researchers, developers, managers, strategic planners and other users with an interest in the research, design and development of data engineering methodologies, strategies and systems. Its scope includes computer science, artificial intelligence, electrical engineering, and computer engineering. It featured papers from all major areas of data engineering, including database design and modeling, performance evaluation, algorithms, integrity, security, fault tolerance, query language, artificial intelligence approaches, knowledge bases, database machines, distributed databases and data engineering applications.