1. 2010 LSITS in Osaka, Japan.
- Author
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Lundquist, Ted
- Subjects
- *
CONFERENCES & conventions , *SEMICONDUCTORS , *LIFE sciences , *AUTOMOTIVE electronics - Abstract
Information on the issues discussed at a symposium hosted by the Institute of LSI Testing on November 10-12, 2010 in Osaka, Japan regarding the progress and future trends on semiconductor analysis is presented. Topics include the most current status, as well as the future trend of car electronics. Furthermore, the December 1, 2010 announcement on the results of the attendees' choice for Best Papers of the Symposium is also discussed.
- Published
- 2011