1. Quantitative dual-energy micro-CT with a photon-counting detector for material science and non-destructive testing.
- Author
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Sellerer, Thorsten, Ehn, Sebastian, Mechlem, Korbinian, Duda, Manuela, Epple, Michael, Noël, Peter B., and Pfeiffer, Franz
- Subjects
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MATERIALS science , *NONDESTRUCTIVE testing , *X-ray imaging , *PARTICLE physics , *ELECTRON density , *GAMMA ray spectrometry - Abstract
The recent progress in photon-counting detector technology using high-Z semiconductor sensors provides new possibilities for spectral x-ray imaging. The benefits of the approach to extract spectral information directly from measurements in the projection domain are very advantageous for material science studies with x-rays as polychromatic artifacts like beam-hardening are handled properly. Since related methods require accurate knowledge of all energy-dependent system parameters, we utilize an adapted semi-empirical model, which relies on a simple calibration procedure. The method enables a projection-based decomposition of photon-counting raw-data into basis material projections. The objective of this paper is to investigate the method’s performance applied to x-ray micro-CT with special focus on applications in material science and non-destructive testing. Projection-based dual-energy micro-CT is shown to be of good quantitative accuracy regarding material properties such as electron densities and effective atomic numbers. Furthermore, we show that the proposed approach strongly reduces beam-hardening artifacts and improves image contrast at constant measurement time. [ABSTRACT FROM AUTHOR]
- Published
- 2019
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